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Mail*Link. SMTP               Seminar Topic for Sept 25 Meeting with Dr Robert*


     
     PHOTOACOUSTIC SPECTROSCOPY WITH AN ATOMIC FORCE MICROSCOPE 
     
     Mark Anderson
     Analytical Chrmistry Group
     Jet Propulsion Laboratory
     California Institute of Technology
     
     An Atomic Force Microscope (AFM) has been used to measure photothermal 
     displacement of a surface, thus acting as a local photoacoustic 
     detector.  This was demonstrated with filter and Fourier Transform 
     Infrared (FTIR) spectrometers on polymer samples.  Similarly, surface 
     fractions were removed by an AFM tip and analyzed by the photothermal 
     deformation of the coated cantilever.  This work shows that the AFM 
     can function both as a precise surface separation device and a 
     detector for spectroscopic analysis.  The use of AFM photoacoustic 
     detection has the potential to enhance the sensitivity, selectivity 
     and spatial resolution of optical spectroscopy.

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Date: 24 Sep 1996 16:20:01 -0700
From: Mark S Anderson <Mark.S.Anderson@jpl.nasa.gov>
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Subject: Seminar Topic for Sept 25 Meeting with Dr Robert Armstrong 
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